Generalized model for interface description
- 31 May 1998
- journal article
- Published by Elsevier in Surface Science
- Vol. 406 (1-3), 69-89
- https://doi.org/10.1016/s0039-6028(98)00094-6
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Slope Selection and Coarsening in Molecular Beam EpitaxyPhysical Review Letters, 1994
- Scanning-tunneling-microscopy study of the growth of cobalt on Cu(111)Physical Review B, 1993
- Growth, Structure and magnetism of Cobalt-Platinum Ultrathin Films and SandwichesMRS Proceedings, 1993
- Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopySurface Science Reports, 1989
- The face dependence of the effective electron mean free path derived from spherical-wave corrections in photoelectron diffraction of W(110) and W(100) surfacesJournal of Physics: Condensed Matter, 1989
- Recent developments in quantitative surface analysis by electron spectroscopyJournal of Vacuum Science & Technology A, 1986
- Auger electron spectroscopy - a local probe for solid surfacesSurface Science Reports, 1981
- Experimental and theoretical study of Co adsorbed at the surface of Cu: Reconstructions, charge-density waves, surface magnetism, and oxygen adsorptionPhysical Review B, 1981
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- One-dimensional dislocations. I. Static theoryProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1949