Concentration profile measurements in thin layers using multiplier resonant nuclear reactions
- 1 May 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 142 (3), 495-498
- https://doi.org/10.1016/0029-554x(77)90689-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de GraaffNuclear Instruments and Methods, 1971
- Energy-Straggling Measurements of Heavy Charged Particles in Thick AbsorbersPhysical Review B, 1970