Diffusion through an Interface—Binary System
- 1 January 1952
- journal article
- research article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 20 (1), 6-9
- https://doi.org/10.1063/1.1700198
Abstract
Diffusion measurements have been made between saturated layers in the system SO2—n‐heptane, using S35 tagged SO2 as a radioactive tracer. The results are evaluated in terms of the interfacial transfer coefficient α introduced in a previous paper. The resistance in the interface is significant compared with the resistance to ordinary diffusion, even within 4°C of the critical solution temperature.Keywords
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