Diffusion through an Interface—Binary System

Abstract
Diffusion measurements have been made between saturated layers in the system SO2n‐heptane, using S35 tagged SO2 as a radioactive tracer. The results are evaluated in terms of the interfacial transfer coefficient α introduced in a previous paper. The resistance in the interface is significant compared with the resistance to ordinary diffusion, even within 4°C of the critical solution temperature.

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