Optoelectronic approach to on-chip device and circuit characterization at microwave and millimeter-wave frequencies
- 1 July 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 39 (7), 1179-1193
- https://doi.org/10.1109/22.85386
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Millimeter-wave monolithic integrated circuit characterization by a picosecond optoelectronic techniqueIEEE Transactions on Microwave Theory and Techniques, 1989
- High-speed optoelectronic pulse generation and sampling systemIEEE Transactions on Instrumentation and Measurement, 1988
- Fabrication of high-speed GaAs photoconductive pulse generators and sampling gates by ion implantationIEEE Transactions on Electron Devices, 1988
- Picosecond Reflectometry Technique for On-Chip Characterization of Millimeter-Wave Semiconductor DevicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1987
- Impulse response of photoconductors in transmission linesIEEE Journal of Quantum Electronics, 1983