Trace-element analysis by X-ray fluorescence with an external proton beam
- 15 June 1975
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 126 (3), 473-474
- https://doi.org/10.1016/0029-554x(75)90715-6
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samplesNuclear Instruments and Methods, 1973