Interpretation of capacitance vs. voltage measurements of p-n junctions
- 29 February 1972
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 15 (2), 195-201
- https://doi.org/10.1016/0038-1101(72)90053-6
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- On the Measurement of Impurity Atom Distributions by the Differential Capacitance Technique [Letter to the Editor]IBM Journal of Research and Development, 1969
- Impurity Distribution in Epitaxial Silicon FilmsJournal of the Electrochemical Society, 1962