Shot noise in GaAs metal semiconductor field effect transistors with high gate leakage current
- 31 October 1994
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 37 (10), 1763-1764
- https://doi.org/10.1016/0038-1101(94)90224-0
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- An edge-defined technique for fabricating submicron metal–semiconductor field effect transistor gatesJournal of Vacuum Science & Technology B, 1990
- Microwave Field-Effect Transistors - 1976IEEE Transactions on Microwave Theory and Techniques, 1976