Photocurrents Through Thin Films of Al2O3
- 1 March 1965
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 36 (3), 796-799
- https://doi.org/10.1063/1.1714221
Abstract
Thin‐film sandwiches of Al–Al2O3–Al have been constructed with Al2O3 layers in the range 80–120 Å thick. When illuminated with light in the wavelength range 2600–11 000 Å, the sandwiches exhibit photocurrents which are larger than the dark current. The photocurrent has been measured at room temperature as a function of bias voltage and photon energy, using light pulses of 0.1‐sec duration. The results are interpreted to give the shape of the potential barrier in the insulator. Within the accuracy of the data, the potential barrier is trapezoidal, with a relative work function of 1.0 eV at the oxidized electrode, and 2.9 eV at the electrode evaporated over the oxide. There is evidence that collisions of the photoelectrons in the insulator are important.Keywords
This publication has 8 references indexed in Scilit:
- Experimental Determination of the Shape of Metal—Insulator—Metal Potential BarriersJournal of Applied Physics, 1964
- Electron Tunneling through Asymmetric Films of Thermally Grown Al2O3Journal of Applied Physics, 1964
- Electric Tunnel Effect between Dissimilar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963
- Theoretical Shape of Metal-Insulator-Metal Potential BarriersJournal of Applied Physics, 1963
- Attenuation Length Measurements of Hot Electrons in Metal FilmsPhysical Review B, 1962
- Electrode Effects on Aluminum Oxide Tunnel JunctionsPhysical Review B, 1962
- Tunneling Through Thin Insulating LayersJournal of Applied Physics, 1961
- The Analysis of Photoelectric Sensitivity Curves for Clean Metals at Various TemperaturesPhysical Review B, 1931