Inelastic scattering and energy filtering in the transmission electron microscope
- 1 July 1976
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 34 (1), 49-65
- https://doi.org/10.1080/14786437608228173
Abstract
Mechanisms are discussed by which plasmon, single-electron and phonon excitation degrade the image contrast and resolution in both conventional and scanning electron microscopes. The relative contributions of different mechanisms and scattering processes are compared and situations are defined in which the benefits of installing an electron-energy filter are most significant.Keywords
This publication has 36 references indexed in Scilit:
- Inelastic scattering of 80 keV electrons in amorphous carbonPhilosophical Magazine, 1975
- A High Resolution Electron Spectrometer for Use in Transmission Scanning Electron MicroscopyReview of Scientific Instruments, 1971
- Single Atom Contrast in a Scanning MicroscopeProceedings, annual meeting, Electron Microscopy Society of America, 1970
- The small-angle scattering of electrons in thin films of evaporated carbonJournal of Physics C: Solid State Physics, 1970
- Investigations of dislocation strain fields using weak beamsPhilosophical Magazine, 1969
- The direct observation of structural features and defects in complex oxides by two-dimensional lattice imagingMaterials Research Bulletin, 1969
- Preservation of electron microscope image contrast after inelastic scatteringPhilosophical Magazine, 1969
- An energy analysing electron microscopeJournal of Scientific Instruments, 1966
- A new calculation of electron scattering cross sections and a theoretical discussion of image contrast in the electron microscopeProceedings of the Physical Society, 1962
- Gegenfeldfilter für Elektronenbeugung und ElektronenmikroskopieThe European Physical Journal A, 1953