Growth and characterization of BiGd garnet thick films on 2-inch-diamter Nd3Ga5O12 substrates.

Abstract

Two inch diameter, 300 μm thick (BiGd)₃(FeGaAl)₅O₁₂ films with a mirror surface were grown on {111} Nd₃Ga₅O₁₂ substrates by liquid phase epitaxy. The extinction ratio was measured for a 30 × 18 mm² specimen cut from a two inch diameter wafer. A ratio of 37 ± 3dB was obtained throughout the specimen. Several swirl patterns were observed at the periphery of the grown films. The swirl consists of a pit followed by a shallow groove, and was revealed to be caused by a shallow pit corresponding to the defect of NdGG substrate. Degradation of the extinction ratio was found at the pit of the swirl.