A Method for Measurement of the Contact and Volume Resistance of Semiconductors
- 1 July 1942
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 13 (7), 298-299
- https://doi.org/10.1063/1.1770042
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Elektrisches und optisches Verhalten von Halbleitern. VI. Leitfähigkeitsmessungen an PulvernAnnalen der Physik, 1932