Fast alignment using probabilistic indexing
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 387-392
- https://doi.org/10.1109/cvpr.1993.341101
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- View variation of point-set and line-segment featuresIEEE Transactions on Pattern Analysis and Machine Intelligence, 1993
- Recognizing solid objects by alignment with an imageInternational Journal of Computer Vision, 1990
- The probabilistic peaking effect of viewed angles and distances with application to 3-D object recognitionIEEE Transactions on Pattern Analysis and Machine Intelligence, 1990