Total reflection X-ray fluorescence spectrometry for surface analysis
- 31 December 1989
- journal article
- review article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 44 (5), 477-481
- https://doi.org/10.1016/0584-8547(89)80053-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Application of total reflection X-ray fluorescence in semiconductor surface analysisSpectrochimica Acta Part B: Atomic Spectroscopy, 1989
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954