Characterization of the Near‐Surface Region of Single‐Crystal Alumina Diffusion Samples Using Rutherford Backscattering and Channeling
- 1 December 1985
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 68 (12), 663-667
- https://doi.org/10.1111/j.1151-2916.1985.tb10121.x
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Lattice Modification in Ion‐Implanted CeramicsJournal of the American Ceramic Society, 1984
- Oxygen Diffusion in SapphireJournal of the American Ceramic Society, 1982
- The thermal behavior of Pt/Al2O3 catalysts studied with the channeling techniquePhysica Status Solidi (a), 1981
- Self-diffusion of oxygen in single crystal aluminaThe Journal of Chemical Physics, 1980
- Ion‐Probe Measurement of Oxygen Self‐Diffusion in Single‐Crystal Al2O3Journal of the American Ceramic Society, 1980
- Backscattering study and theoretical investigation of planar channeling processes. I. Experimental resultsPhysical Review B, 1975
- Application of a nondestructive single-spectrum proton activation technique to study oxygen diffusion in zinc oxideJournal of Applied Physics, 1973
- Slip Systems in Al2O3Journal of the American Ceramic Society, 1973
- Plastic Deformation of Aluminum Oxide by Indentation and AbrasionJournal of the American Ceramic Society, 1971
- Impurity Deposits on Alumina CrystalsJournal of the American Ceramic Society, 1969