Fast Response Magnetometer Using Ferromagnetic Resonance in Thin Films

Abstract

A magnetometer of simple construction is described having a response time of the order of 4 nsec. In this instrument the impedance of a thin film biased near ferromagnetic resonance is a measure of the external field. At resonance the element may be matched to a transmission line. The voltage amplitude of the reflected wave varies linearly with change in the external magnetic field.