Characterization of real surfaces of vitreous silica by ellipsometry
- 30 November 1974
- journal article
- Published by Elsevier in Materials Research Bulletin
- Vol. 9 (11), 1503-1509
- https://doi.org/10.1016/0025-5408(74)90097-x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Ellipsometric Parameters of Rough Surfaces and of a System Substrate-Thin Film with Rough BoundariesOptica Acta: International Journal of Optics, 1972
- Properties of Glass SurfacesAnnual Review of Materials Science, 1972
- Characterization of real surfaces by ellipsometrySurface Science, 1972
- Ellipsometry with rough surfaceOptics Communications, 1970
- Errors arising from surface roughness in ellipsometric measurement of the refractive index of a surfaceSurface Science, 1969
- Ellipsometric study of polished glass surfacesSurface Science, 1969