X-ray diffraction from small-angle twist boundaries

Abstract

It is demonstrated for the first time that grain boundaries can be studied using X-ray diffraction techniques. Thin film gold bicrystal specimens containing small-angle twist boundaries were examined with Cu K_α radiation, and arrays of extra reflections in the vicinity of f.c.c. reflections were detected. The relative intensities of the extra reflections were in qualitative agreement with structure factor calculations. The advantage of X-ray diffraction over electron diffraction for the study of the structure of grain boundaries is discussed