Observation of noise temperature in the Millikelvin range

1 January 1971

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 59 (9), 1368-1369
https://doi.org/10.1109/PROC.1971.8426

Abstract

We report some measurements of noise at very low temperatures, with emphasis on the design and performance of the system used. This system is based on the Josephson effect, and has an observed noise temperature less than 0.005 K.

Keywords

TEMPERATURE DISTRIBUTION
SUPERCONDUCTING DEVICE NOISE
JOSEPHSON JUNCTIONS
NOISE MEASUREMENT
NIOBIUM
RESISTORS
CIRCUIT NOISE
FREQUENCY MEASUREMENT
THERMAL RESISTANCE
VOLTAGE

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