Thickness dependence of the Kondo effect in AuFe films
- 14 January 1991
- journal article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 66 (2), 209-211
- https://doi.org/10.1103/physrevlett.66.209
Abstract
We have studied the Kondo effect in thin films of AuFe, through measurements of the temperature dependence of the resistivity, Δρ(T). At low temperatures, we find Δρ=-B ln(T), as expected for the Kondo effect. We have also found that the factor B becomes smaller as the film thickness is reduced. This result is discussed in terms of the effect of the film thickness on the conduction-electron screening cloud which forms around the magnetic impurities, and the associated crossover from three- to two-dimensional behavior. Studies of bilayer films, which seem to support this interpretation, are also described.Keywords
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