New Results on the Rectifying Process in Surface Barrier Counters

Abstract

In order to understand the rectifying process involved in silicon surface barrier nuclear particle counters, we have substituted the usual gold contact with various metals. The results obtained from this substitution with twenty different metals are given. New results concerning the formation of the rectifying process for the case of gold-silicon diodes are presented. In particular, we have considered the resistivity of silicon, and the thickness of the gold film.