Domain observation in MnBi films with the scanning electron microscope
- 1 August 1976
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 9 (11), L131-L135
- https://doi.org/10.1088/0022-3727/9/11/004
Abstract
The scanning electron microscope (SEM) has been successfully used to detect (type I) magnetic contrast in thin films of MnBi. The domain structures observed consisted of an irregular patchwork, typical of these films in the as-deposited condition, with a domain width in the region of 3 mu m. Efforts to resolve the maze domain configuration (spacing approximately 0.3 mu m) with the SEM were however not successful.Keywords
This publication has 8 references indexed in Scilit:
- Magnetic contrast in the scanning electron microscopeIEEE Transactions on Magnetics, 1975
- Magnetic contrast in secondary electron images of uniaxial ferromagnetic materials obtained by scanning electron microscopyPhysica Status Solidi (a), 1975
- Growth of MnBi Films on MicaJournal of Applied Physics, 1971
- Magnetic Contrast in the Scanning Electron MicroscopeJournal of Applied Physics, 1971
- Scanning electron microscope study of the magnetic domain structure of cobalt single crystalsJournal of Physics D: Applied Physics, 1969
- Direct observation of magnetic domains by scanning electron microscopyPhilosophical Magazine, 1968
- On the theory of the domain structure of thin films of magnetically uni-axial materialsCzechoslovak Journal of Physics, 1958
- Magnetic Writing on Thin Films of MnBiJournal of Applied Physics, 1957