Scaling effects in AlGaN/GaN HEMTs: Comparison between Monte Carlo simulations and experimental data
- 1 July 2006
- journal article
- Published by Springer Science and Business Media LLC in Journal of Computational Electronics
- Vol. 5 (2), 109-113
- https://doi.org/10.1007/s10825-006-8828-z
Abstract
No abstract availableKeywords
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