A large-signal GaAs MESFET model implemented on SPICE

Abstract
A device model that predicts large-signal GaAs MESFET performance has been implemented on the large-scale circuit simulation program SPICE. The model takes into consideration drift velocity saturation, channel length modulation, and subthreshold current effects. In addition, the model depends primarily on physical (i.e. material and geometric) rather than empirical parameters. Combined with the SPICE program, a general CAD tool is formed which can be used to aid in the design of GaAs circuits such a power amplifiers, oscillators, mixers, and fast-switching digital integrated circuits. Model predictions are compared to measured device performance, and limitations of this large-signal circuit design approach are discussed.