Effect of primary beam energy on the secondary-ion sputtering efficiency of liquid secondary-ionization mass spectrometry in the 5-30-keV range
- 15 July 1988
- journal article
- research article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 60 (14), 1426-1428
- https://doi.org/10.1021/ac00165a016
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Cooled sample introduction probe for liquid secondary ionization mass spectrometryAnalytical Biochemistry, 1986
- Secondary ion mass spectrometry with cesium ion primary beam and liquid target matrix for analysis of bioorganic compoundsAnalytical Chemistry, 1982
- Revised structure for the 6-O-methylglucose polysaccharide of Mycobacterium smegmatis.Journal of Biological Chemistry, 1982