Field-Ion Microscopy of Graphite

Abstract

Streaks in FIM images from graphite are shown to be transverse to the layer planes. Hence, the streaks are not images of layer‐plane edges but distorted point images. Streaking is thus an intrinsic feature of the field‐ion microscopy of graphite, resulting from its two‐dimensional crystal structure. Therefore, structural studies of graphite by this technique are not feasible with the present methods of sample preparation.