Simple Measurement Technique for Voltage Dependent Capacitances
- 1 October 1969
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 40 (11), 4665-4666
- https://doi.org/10.1063/1.1657253
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- A technique for directly plotting the inverse doping profile of semiconductor wafersIEEE Transactions on Electron Devices, 1969
- Vereinfachte und erweiterte Theorie der Randschicht-gleichrichterThe European Physical Journal A, 1942