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Surface Roughness of Silicon Wafers on Different Lateral Length Scales
Home
Publications
Surface Roughness of Silicon Wafers on Different Lateral Length Scales
Surface Roughness of Silicon Wafers on Different Lateral Length Scales
IM
Igor J. Malik
Igor J. Malik
SP
Saeed Pirooz
Saeed Pirooz
LS
Larry W. Shive
Larry W. Shive
Alison J. Davenport
Alison J. Davenport
CV
Carissima M. Vitus
Carissima M. Vitus
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1 May 1993
journal article
Published by
The Electrochemical Society
in
Journal of the Electrochemical Society
Vol. 140
(5)
,
L75-L77
https://doi.org/10.1149/1.2221500
Abstract
No abstract available
Cited by 20 articles