Measurement of the Excited-State Lifetime of a Microelectronic Circuit
- 17 January 2003
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 90 (2), 027002
- https://doi.org/10.1103/physrevlett.90.027002
Abstract
We demonstrate that a continuously measured microelectronic circuit, the Cooper-pair box measured by a radio-frequency single-electron transistor, approximates a quantum two-level system. We extract the Hamiltonian of the circuit through resonant spectroscopy and measure the excited-state lifetime. The lifetime is more than times longer than the inverse transition frequency of the two-level system, even though the measurement is active. This lifetime is also comparable to an estimate of the known upper limit, set by spontaneous emission, for this circuit.
Keywords
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