The device enables electron microscope specimens to be tilted smoothly in any direction up to [plus or minus] 10[degree] away from the electron beam axis. The normal specimen level in the objective lens is maintained and hence no loss in resolution arises. Also the specimen holder of the device may be inserted through the usual microscope air-lock. Although the instrument is designed to be used in the Siemens Elmiskop I, the principles employed would be applicable to many other electron microscopes.