A method for handling long range oscillatory potentials in the study of planar defects
- 1 March 1976
- journal article
- Published by IOP Publishing in Journal of Physics F: Metal Physics
- Vol. 6 (3), L63-L65
- https://doi.org/10.1088/0305-4608/6/3/001
Abstract
The method consists of calculating the Fourier coefficients of the atom-plane interaction. It is shown how to calculate these coefficients when starting from a pair potential given numerically in real space. The Fourier expansion converges very quickly so that it provides a very convenient method for the study of planar defects.Keywords
This publication has 4 references indexed in Scilit:
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