Surface Electric-Field—Induced Raman Scattering in PbTe and SnTe

Abstract
Electric-field-induced scattering by normally Raman-inactive LO phonons is observed in the IV-VI-compound (NaCl structure) semiconductors PbTe and SnTe with Pb films on p-type samples to induce energy-band bending. The observed Raman peaks correspond to unscreened q0 LO phonons. A discussion of the mechanisms contributing to the surface field-induced Raman scattering in these materials is presented.

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