On the Second‐Order and Orientation Analysis of Planar Stationary Point Processes
- 18 January 1981
- journal article
- research article
- Published by Wiley in Biometrical Journal
- Vol. 23 (6), 523-533
- https://doi.org/10.1002/bimj.4710230602
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- On Parameter Estimation and Goodness-of-Fit Testing for Spatial Point PatternsBiometrics, 1979
- Applied Stochastic Geometry: A Survey (Invited Paper)Biometrical Journal, 1979
- Interrupted Point ProcessesBiometrical Journal, 1979
- The second-order analysis of stationary point processesJournal of Applied Probability, 1976
- Station re zuf llige Ma e auf lokalkompakten Abelschen GruppenProbability Theory and Related Fields, 1967