On twinning in crystallized copper layers on a 111 nickel surface
- 31 December 1976
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 36 (2), 249-254
- https://doi.org/10.1016/0022-0248(76)90284-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- On the morphology of electrocrystallized copperJournal of Crystal Growth, 1972
- The nucleation, growth, structure and epitaxy of thin surface filmsAdvances in Physics, 1965
- Method of Representing Preferred Orientation DataJournal of Applied Physics, 1956
- Film Thickness by X-Ray Emission SpectrographyAnalytical Chemistry, 1956
- A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949