Low-angle X-ray diffraction study of solid state amorphization in an NiTi multilayer
- 30 June 1988
- journal article
- Published by Elsevier in Journal of the Less Common Metals
- Vol. 140, 33-48
- https://doi.org/10.1016/0022-5088(88)90365-7
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- X-ray characterization of amorphous multilayersScripta Metallurgica, 1986
- Thermodynamic and kinetic aspects of the crystal to glass transformation in metallic materialsProgress in Materials Science, 1986
- An exact analytic solution of Darwin's difference equationsActa Crystallographica Section A Foundations of Crystallography, 1984
- NbZr multilayers. I. Structure and superconductivityPhysical Review B, 1984