Simple Light Spot Scanner and Its Application on Semiconductor Nuclear Particle Detectors
- 1 October 1967
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (10), 1374-1376
- https://doi.org/10.1063/1.1720542
Abstract
An apparatus has been designed and built for scanning the surface of a semiconductor device with a light spot. The apparatus uses a modified commercial television set for the display of the photoresponse and a miniature CRT as flying spot source. Photoresponse pictures of lithium‐drifted silicon radiation detectors as well as of surface barrier type detectors are shown and interpretation is attempted.Keywords
This publication has 4 references indexed in Scilit:
- Observation of surface phenomena on semiconductor devices by a light spot scanning methodSolid-State Electronics, 1967
- Fabrication methods for lithium drifted surface barrier silicon detectorsNuclear Instruments and Methods, 1966
- Anisotropic Energy Loss of Light Particles of MeV Energies in Thin Silicon Single CrystalsPhysical Review Letters, 1964
- The Channelling of Ions through Silicon DetectorsIEEE Transactions on Nuclear Science, 1964