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Error correction at four-port on-wafer S-parameter measurements
Home
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Error correction at four-port on-wafer S-parameter measurements
Error correction at four-port on-wafer S-parameter measurements
FM
F. Mernyei
F. Mernyei
IA
I. Aoki
I. Aoki
HM
H. Matsuura
H. Matsuura
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17 December 2002
conference paper
Published by
Institute of Electrical and Electronics Engineers (IEEE)
https://doi.org/10.1109/imtc.1994.351971
Abstract
No abstract available
Keywords
FOUR PORT
ERROR CORRECTION
PARAMETER MEASUREMENTS
WAFER S PARAMETER
CORRECTION AT FOUR
PORT ON WAFER
Cited by 2 articles