Ermittlung kleiner Diffusionskoeffizienten mittels SIMS in oxydischen Verbindungen
- 1 January 1977
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Monolagenanalyse an „schmutzigen”︁ Oberflächen?Physikalische Blätter, 1976
- Distortion of na-concentration profiles in thin glassy surface layers by ion bombardmentRadiation Effects, 1976
- Secondary ion emission from silicon and silicon oxideSurface Science, 1975
- Measurement of atomic concentration profiles in thin films using nonresonant nuclear reactionsJournal of Physics D: Applied Physics, 1974
- Oxygen diffusion studies using nuclear reactionsJournal of Physics D: Applied Physics, 1974
- Application of a nondestructive single-spectrum proton activation technique to study oxygen diffusion in zinc oxideJournal of Applied Physics, 1973
- Investigation of surface layers by SIMS and SIIMSSurface Science, 1973
- A Method of Utilizing Nuclear Reactions in the Study of Oxide LayersJournal of Applied Physics, 1966