Material analysis with ion beams
- 1 November 1976
- journal article
- other
- Published by AIP Publishing in Physics Today
- Vol. 29 (11), 52-59
- https://doi.org/10.1063/1.3024506
Abstract
All methods of material analysis by target stimulation, whether by photons, electrons or ions, yield a mixture of quantitative and qualitative information. Those techniques that give quantitative information are usually weak on qualitative chemical‐binding information, because they are insensitive to the complex perturbations of the outer‐shell binding electrons. Energetic ion beams, which interact only with target nuclei, are usually very quantitative and provide no binding information at all. This aspect of ion‐beam analysis is its prime asset.Keywords
This publication has 2 references indexed in Scilit:
- New precision technique for measuring the concentration versus depth of hydrogen in solidsApplied Physics Letters, 1976
- Depth distribution profiling of deuterium and 3HeJournal of Nuclear Materials, 1974