X‐ray fluorescence analysis — results of a first round intercomparison study
- 1 January 1974
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 3 (1), 47-50
- https://doi.org/10.1002/xrs.1300030110
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Trace element determination with semiconductor detector x-ray spectrometersAnalytical Chemistry, 1973
- Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samplesNuclear Instruments and Methods, 1973
- Semiconductor Detector X-Ray Fluorescence Spectrometry Applied to Environmental and Biological AnalysisIEEE Transactions on Nuclear Science, 1972