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Quantitative Description of Si3N4 Microstructures
Home
Publications
Quantitative Description of Si3N4 Microstructures
Quantitative Description of Si3N4 Microstructures
FM
F. Mücklich
F. Mücklich
SH
S. Hartmann
S. Hartmann
Michael J. Hoffmann
Michael J. Hoffmann
GS
Gerold A. Schneider
Gerold A. Schneider
JO
J. Ohser
J. Ohser
GP
Günter Petzow
Günter Petzow
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1 August 1993
journal article
Published by
Trans Tech Publications, Ltd.
in
Key Engineering Materials
Vol. 89-91
,
465-470
https://doi.org/10.4028/www.scientific.net/kem.89-91.465
Abstract
No abstract available
Keywords
STEREOLOGY
IMAGE ANALYSIS
MICROSTRUCTURE CHARACTERIZATION
Cited by 2 articles