High temperature operation of ISE devices and circuits

Publisher Website

13 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/soi.1989.69815

Abstract

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Keywords

This publication has 1 reference indexed in Scilit:

Determination of minority-carrier generation lifetime in beam-recrystallized silicon-on-insulator structure by using a depletion-mode transistor
Applied Physics Letters, 1985

Cited by 9 articles