H2 and rare gas field ion source with high angular current

Abstract
We have built and carried out initial tests on a field ion source that has been designed to operate at very low temperatures with a physisorbed surface supply to the ionization region. This mode has been found to give beams of high angular current density and is expected to have low energy spread in the beam. Presently we have measured dI/dΩ?10 to 60/sr with a probable energy spread of ?l eV. The UHV system allows processing of the field emitter under clean, high vacuum conditions. A liquid He cooled finger maintains the tip at controlled temperatures from that of liquid He to room temperature. The tip is mounted on a sapphire block to provide both excellent thermal conduction and electrical insulation to ?30 kV. Differential pumping allows a high supply pressure of H2, He, Ar, etc. in the region of the tip (≳ 10−2 Torr) and a low pressure in the rest of the system. Observation on the characteristics of the field ionization pattern are made under varying conditions of pressure, temperature, field and tip processing, and orientation by using a channel electron multiplier array and phosphor screen (CEMA). An alignable aperture defines the angular divergence.