High spatial resolution micro‐Raman temperature measurements of nitride devices (FETs and light emitters)
- 28 February 2005
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 202 (5), 824-831
- https://doi.org/10.1002/pssa.200461294
Abstract
No abstract availableKeywords
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