A model of a rough surface, perfectly conducting identical hemispherical humps on a perfectly conducting plane, was constructed and tested through scanning the surface with a 35 GHz microwave beam. The surface statistics were controlled in accordance with a specially developed coordinate distribution function that gave a good approximation to a uniform distribution and took into account the finite size of the scattering objects. The results of a statistical analysis of experimental data were compared with similar results from a Monte-Carlo simulation and sources of errors in both cases were discussed.