Measurement of High Resistivities by the Electrodeless Falling Sample Method
- 1 May 1968
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 39 (5), 778
- https://doi.org/10.1063/1.1683507
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Electrodeless Measurement of Resistivities over a Very Wide RangeReview of Scientific Instruments, 1967
- Contactless resistivity meter for semiconductorsJournal of Scientific Instruments, 1961
- Radio-Frequency Carrier and Capacitive Coupling Procedures for Resistivity and Lifetime Measurements on SiliconJournal of the Electrochemical Society, 1961
- Contactless Method for the Estimation of Resistivity and Lifetime of SemiconductorsReview of Scientific Instruments, 1956