Dielectric relaxation from a network of charged defects in dilute CeO2:Y2O3 solid solutions
- 31 October 1981
- journal article
- Published by Elsevier in Solid State Ionics
- Vol. 5, 551-554
- https://doi.org/10.1016/0167-2738(81)90314-3
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Oxygen-ion conductivity and defect interactions in yttria-doped ceriaSolid State Ionics, 1981
- The “grain-boundary effect” in doped ceria solid electrolytesJournal of Solid State Chemistry, 1980
- Ionic Thermocurrents in DielectricsPhysical Review B, 1966
- Mechanical and Electrical Relaxation in ThContaining CaOPhysical Review B, 1963