In-depth profile of altered layers of copper-nickel alloys formed by sputtering
- 2 December 1977
- journal article
- Published by Elsevier in Surface Science
- Vol. 69 (2), 721-726
- https://doi.org/10.1016/0039-6028(77)90148-0
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- A quantitative analysis of surface segregation and in-depth profile of copper-nickel alloysSurface Science, 1976
- Auger study of preferred sputtering on binary alloy surfacesSurface Science, 1976
- Ion sputtering of alloysJournal of Vacuum Science and Technology, 1976
- Observation of surface composition of copper-nickel alloy by auger spectra in the lower energy region (at around 100 eV)Surface Science, 1975
- The application of electron spectroscopy to surface studiesJournal of Vacuum Science and Technology, 1974
- Quantitative auger analysis of copper-nickel alloy surfaces after argon ion bombardmentSurface Science, 1973
- Diffusion of Ni-63 in alpha-irradiated copperActa Metallurgica, 1965