Direct Transform-Deconvolution Method for Surface-Structure Determination
- 2 September 1974
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 33 (10), 585-589
- https://doi.org/10.1103/physrevlett.33.585
Abstract
We describe direct method for surface-structure determination from low-energy electron-diffraction (LEED) intensities. Fourier transforms of LEED intensities are shown to contain convolution products of functions of the interatomic vectors with data truncation and potential windows. A deconvolution method and substrate-subtraction procedure is described, yielding an accurate structural determination of clean surfaces and overlayer systems. Applicability of the method to experimental data is demonstrated by using LEED intensities from A1(100)Keywords
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