A scanning near‐field optical microscope having scanning electron tunnelling microscope capability using a single metallic probe tip
- 1 April 1995
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 178 (1), 14-19
- https://doi.org/10.1111/j.1365-2818.1995.tb03575.x
Abstract
No abstract availableKeywords
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