Thermally activated phase slippage in high-grain-boundary Josephson junctions
- 8 January 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 64 (2), 228-231
- https://doi.org/10.1103/physrevlett.64.228
Abstract
The effect of thermally activated phase slippage (TAPS) in grain-boundary Josephson junctions has been studied. TAPS has been found to be responsible for the dc noise voltage superimposed on the dc Josephson current near the transition temperature. Because of the reduced Josephson coupling energy of the grain-boundary junctions, which is caused by a reduced superconducting order parameter at the grain-boundary interface, TAPS is present over a considerable temperature range. The implications of TAPS on the applicability of high- Josephson junctions are outlined.
Keywords
This publication has 10 references indexed in Scilit:
- Vortex phases and dissipation in high-temperature superconducting oxidesPhysical Review B, 1989
- Spatially Resolved Observation of Supercurrents Across Grain Boundaries in YBaCuO FilmsScience, 1989
- Epitaxial films of YBa2Cu3O7−δ on NdGaO3, LaGaO3, and SrTiO3 substrates deposited by laser ablationApplied Physics Letters, 1989
- Critical Currents in [001] Grains and across Their Tilt Boundaries in Y FilmsPhysical Review Letters, 1988
- Resistive Transition of High-Temperature SuperconductorsPhysical Review Letters, 1988
- Orientation Dependence of Grain-Boundary Critical Currents inBicrystalsPhysical Review Letters, 1988
- Giant Flux Creep and Irreversibility in an Y-Ba-Cu-O Crystal: An Alternative to the Superconducting-Glass ModelPhysical Review Letters, 1988
- Direct measurement of the superconducting properties of single grain boundaries inPhysical Review Letters, 1988
- Origin of superconductive glassy state and extrinsic critical currents in high-oxidesPhysical Review Letters, 1987
- Voltage Due to Thermal Noise in the dc Josephson EffectPhysical Review Letters, 1969